发明名称 |
Variable speed data storage device testing system |
摘要 |
A data storage device can be tested while spinning at a variety of different speeds. Data may be written to a data sector with a transducing head while at least one disk of a data storage device spins about a spindle at a default speed. One or more tests can subsequently be executed on the disk by reading servo data stored on the disk while the disk spins at a test speed that is greater than the default speed. |
申请公布号 |
US9552846(B1) |
申请公布日期 |
2017.01.24 |
申请号 |
US201615141178 |
申请日期 |
2016.04.28 |
申请人 |
Seagate Technology LLC |
发明人 |
Lim Teck Khoon |
分类号 |
G11B5/00;G11B27/36;G11B5/09;G11B19/28 |
主分类号 |
G11B5/00 |
代理机构 |
Hall Estill Attorneys at Law |
代理人 |
Hall Estill Attorneys at Law |
主权项 |
1. An apparatus comprising:
a disk rotating about a spindle; and a transducing head configured to write data to the disk while the disk rotates at a default speed and conduct at least one test on the disk by reading servo data stored on the disk while the disk rotates at a test speed that is greater than the default speed. |
地址 |
Cupertino CA US |