发明名称 Variable speed data storage device testing system
摘要 A data storage device can be tested while spinning at a variety of different speeds. Data may be written to a data sector with a transducing head while at least one disk of a data storage device spins about a spindle at a default speed. One or more tests can subsequently be executed on the disk by reading servo data stored on the disk while the disk spins at a test speed that is greater than the default speed.
申请公布号 US9552846(B1) 申请公布日期 2017.01.24
申请号 US201615141178 申请日期 2016.04.28
申请人 Seagate Technology LLC 发明人 Lim Teck Khoon
分类号 G11B5/00;G11B27/36;G11B5/09;G11B19/28 主分类号 G11B5/00
代理机构 Hall Estill Attorneys at Law 代理人 Hall Estill Attorneys at Law
主权项 1. An apparatus comprising: a disk rotating about a spindle; and a transducing head configured to write data to the disk while the disk rotates at a default speed and conduct at least one test on the disk by reading servo data stored on the disk while the disk rotates at a test speed that is greater than the default speed.
地址 Cupertino CA US