发明名称 |
SEMICONDUCTOR SUBSTRATES AND METHODS FOR PROCESSING SEMICONDUCTOR SUBSTRATES |
摘要 |
Semiconductor substrates and methods for fabricating integrated circuits are provided. A method for fabricating an integrated circuit includes providing a semiconductor substrate having an outer edge, a central region, and a peripheral region between the outer edge and the central region. The semiconductor substrate also has an upper surface. The method includes forming an amorphous material over the upper surface of the semiconductor substrate in the peripheral region. Also, the method includes irradiating the upper surface of the semiconductor substrate, wherein the amorphous material inhibits cracking at the outer edge of the semiconductor substrate. |
申请公布号 |
US2017018426(A1) |
申请公布日期 |
2017.01.19 |
申请号 |
US201514798796 |
申请日期 |
2015.07.14 |
申请人 |
GLOBALFOUNDRIES, Inc. |
发明人 |
Ray Shishir;Gaan Sandeep;Meyers Sheldon;Pillai Nisha;Banghart Edmund Kenneth;Jung Kyle |
分类号 |
H01L21/02;H01L29/16 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method for processing a semiconductor substrate, the method comprising:
providing the semiconductor substrate having an outer edge, a central region, and a peripheral region between the outer edge and the central region, wherein the semiconductor substrate has an upper surface; forming an amorphous material directly on the upper surface of the semiconductor substrate in the peripheral region; irradiating the upper surface of the semiconductor substrate; and inhibiting cracking at the outer edge of the semiconductor substrate with the amorphous material. |
地址 |
Grand Cayman KY |