| 摘要 |
The present technology pertains to an inspection method, a program, and an inspection device for enabling an accurate correction of measurement light. The inspection device determines a measurement-light-source-corresponding correction gain, that corresponds to a measurement light source, on the basis of: a table in which reference spectrum information is associated with correction gains for correcting measurement spectrum information, about an object to be inspected, obtained through sensing performed under the measurement light source; and measurement spectrum information, about a reference reflection plate, obtained through sensing performed under the measurement light source, whereby the inspection device corrects, on the basis of the determined measurement-light-source-corresponding correction gain, the measurement spectrum information, about the object to be inspected, obtained through sensing performed under the measurement light source. The present technology can be applied to, for example, a vegetation inspection device that measures a vegetation index such as a Normalized Difference Vegetation Index (NDVI). |
