发明名称 Method for manufacturing a thin film transistor array panel
摘要 A thin film transistor array panel includes a substrate, an insulation layer, a first semiconductor, and a second semiconductor. The insulation layer is disposed on the substrate and includes a stepped portion. The first semiconductor is disposed on the insulation layer. The second semiconductor is disposed on the insulation layer and includes a semiconductor material different than the first semiconductor. The stepped portion is spaced apart from an edge of the first semiconductor.
申请公布号 US9548325(B2) 申请公布日期 2017.01.17
申请号 US201614992625 申请日期 2016.01.11
申请人 Samsung Display Co., Ltd. 发明人 Chin Hong-Kee;Yeo Yun Jong;Kim Sang Gab;Bang Jung Suk;Cho Byeong Hoon
分类号 H01L21/84;H01L21/00;H01L21/8234;H01L27/12;H01L21/306;H01L21/308;H01L21/3213;H01L27/144;H01L31/0376;H01L31/113;H01L31/20 主分类号 H01L21/84
代理机构 H.C. Park & Associates, PLC 代理人 H.C. Park & Associates, PLC
主权项 1. A method of manufacturing a thin film transistor array panel, comprising: forming a first insulation layer on a substrate; forming a first semiconductor material layer on the first insulation layer; forming an etching passivation material layer on the first semiconductor material layer; forming a first photoresist layer on the etching passivation material layer; etching, using the first photoresist layer as a mask, the etching passivation material layer to form an etching passivation layer; etching, using the first photoresist layer as a mask, the first semiconductor material layer to form a first semiconductor pattern comprising a protrusion not covered by the etching passivation layer; forming, sequentially, a second insulation layer and a second semiconductor material layer on the etching passivation layer and the first semiconductor pattern; forming a second photoresist layer on the second semiconductor material layer; etching, using the second photoresist layer as a mask, the second semiconductor material layer to form a first semiconductor; etching the first insulation layer not covered by the second photoresist layer and the protrusion not covered by the etching passivation layer to form a second semiconductor comprising an undercut region under the etching passivation layer; and forming, in the first insulation layer, a stepped portion spaced apart from an edge of the second semiconductor.
地址 Yongin-si KR