发明名称 Device and method for making photomask assembly and photodetector device having light-collecting optical microstructure
摘要 An optical mask can be made by providing a transparent mask substrate; depositing a first layer of opaque material, forming an aperture in the first layer; depositing a second layer of transparent material, depositing a third layer of transparent material; patterning the third layer to produce a disc-shaped region, heating the third layer until the disc-shaped region reflows into a lens-shaped region and cross-links, depositing a fourth layer, patterning the fourth layer to produce a cavity extending to the surface of the lens-shaped region, and dry etching the end of the cavity until the second layer develops a shape corresponding to the lens-shaped region.
申请公布号 US9547231(B2) 申请公布日期 2017.01.17
申请号 US201414229859 申请日期 2014.03.29
申请人 Avago Technologies General IP (Singapore) Pte. Ltd. 发明人 Wang Tak Kui;Giovane Laura M.;Murty Ramana M. V.
分类号 H01L31/0232;G03F1/50;G03F1/76;G03F1/80;H01L33/48;H01L27/146;G02B3/00 主分类号 H01L31/0232
代理机构 代理人
主权项 1. A semiconductor assembly, comprising: an optical mask for use in fabricating a semiconductor device, the optical mask having an optical mask substrate comprising a first alignment indicator; a wafer comprising a second alignment indicator; and a refractive alignment lens etched into a glass layer, the glass layer having a first surface that is in contact with the optical mask substrate and an opposing surface that is in contact with the wafer to facilitate a visual alignment of the first alignment indicator with the second alignment indicator, wherein the refractive alignment lens is etched at a location on the glass layer that is aligned with a viewing axis extending between the first alignment indicator and the second alignment indicator, the location selected to configure the alignment lens to project an image of the second alignment indicator into the optical mask substrate and provide an effective distance that is smaller than an actual distance between the first alignment indicator and the second alignment indicator for overcoming a parallax effect when the second alignment indicator is viewed along the viewing axis during the visual alignment.
地址 Singapore SG