发明名称 ウェーハの加工方法
摘要 PROBLEM TO BE SOLVED: To provide a wafer processing method capable of preventing wafer breakage when peeling a support member from a thinly ground wafer.SOLUTION: A wafer processing method comprises the steps of: forming a groove (D) deeper than a finishing thickness (t) of a wafer (W) by irradiating a surface (W1) side of the wafer (W) with a laser beam along a division schedule line; opposing a surface of the wafer to a metallic support member (S) applied with a resin (R), pressing the wafer, and sticking and fixing the wafer to the support member by curing the resin (wafer sticking step); thinning the wafer to the finishing thickness by grinding a rear surface (W2) of the wafer, exposing the groove to the rear surface side of the wafer, and dividing the wafer (rear surface grinding step); sticking an expand tape (T2) to the rear surface of the wafer; and softening the resin and peeling the support member and the resin from the wafer by curving the support member (peeling step).
申请公布号 JP6057616(B2) 申请公布日期 2017.01.11
申请号 JP20120187965 申请日期 2012.08.28
申请人 株式会社ディスコ 发明人 下谷 誠
分类号 H01L21/301;H01L21/304 主分类号 H01L21/301
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