发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor device, including an active region defined in a semiconductor substrate; a first contact plug on the semiconductor substrate, the first contact plug being connected to the active region; a bit line on the semiconductor substrate, the bit line being adjacent to the first contact plug; a first air gap spacer between the first contact plug and the bit line; a landing pad on the first contact plug; a blocking insulating layer on the bit line; and an air gap capping layer on the first air gap spacer, the air gap capping layer vertically overlapping the first air gap spacer, the air gap capping layer being between the blocking insulating layer and the landing pad, an upper surface of the blocking insulating layer being at a height equal to or higher than an upper surface of the landing pad.
申请公布号 US2017005097(A1) 申请公布日期 2017.01.05
申请号 US201615196273 申请日期 2016.06.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM Eun-Jung;KIM Bong-Soo;KIM Yong-Kwan;HAN Sung-Hee;HWANG Yoo-Sang
分类号 H01L27/108;H01L21/768;H01L23/532;H01L23/528;H01L23/522 主分类号 H01L27/108
代理机构 代理人
主权项 1. A semiconductor device, comprising: an active region defined in a semiconductor substrate; a first contact plug on the semiconductor substrate, the first contact plug being connected to the active region; a bit line on the semiconductor substrate, the bit line being adjacent to the first contact plug; a first air gap spacer between the first contact plug and the bit line; a landing pad on the first contact plug; a blocking insulating layer on the bit line; and an air gap capping layer on the first air gap spacer, the air gap capping layer vertically overlapping the first air gap spacer, the air gap capping layer being between the blocking insulating layer and the landing pad, an upper surface of the blocking insulating layer being at a height equal to or higher than an upper surface of the landing pad.
地址 Suwon-si KR