发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes a first transistor including a first electrode, a first insulating layer above the first electrode, the first insulating layer having a first side wall, a first oxide semiconductor layer on the first side wall, the first oxide semiconductor layer being connected with the first electrode, a first gate electrode, a first gate insulating layer, and a second electrode above the first insulating layer, the second electrode being connected with the first oxide semiconductor layer; and a second transistor including a third electrode, a fourth electrode separated from the third electrode, a second oxide semiconductor layer between the third electrode and the fourth electrode, the second oxide semiconductor layer being connected with each of the third electrode and the fourth electrode, a second gate electrode, and a second gate insulating layer.
申请公布号 US2017005200(A1) 申请公布日期 2017.01.05
申请号 US201615186625 申请日期 2016.06.20
申请人 Japan Display Inc. 发明人 SASAKI Toshinari
分类号 H01L29/786;H01L27/12;H01L29/423 主分类号 H01L29/786
代理机构 代理人
主权项 1. A semiconductor device, comprising: a first transistor including: a first electrode;a first insulating layer above the first electrode, the first insulating layer having a first side wall;a first oxide semiconductor layer on the first side wall, the first oxide semiconductor layer being connected with the first electrode;a first gate electrode facing the first oxide semiconductor layer;a first gate insulating layer between the first oxide semiconductor layer and the first gate electrode; anda second electrode above the first insulating layer, the second electrode being connected with the first oxide semiconductor layer; and a second transistor including: a third electrode;a fourth electrode separated from the third electrode;a second oxide semiconductor layer between the third electrode and the fourth electrode, the second oxide semiconductor layer being connected with each of the third electrode and the fourth electrode;a second gate electrode facing the second oxide semiconductor layer; anda second gate insulating layer between the second oxide semiconductor layer and the second gate electrode.
地址 Tokyo JP