发明名称 STRUCTURED COPPER STRAIN BUFFER
摘要 <p>A structured copper strain buffer, which is thermally and electrically conductive is provided for use with semiconductor electronic devices. A thermocompression diffusion bond is used to attach a metallic foil two a structured copper disk to form the strain buffer. The individual strands of copper within the strain buffer are capable of independent movement. The structured copper strain buffer provides a means of attachment to a semiconductor device without causing a stress to be generated at the attached surface of the device as the device expands and contacts with temperature changes.</p>
申请公布号 CA1139013(A) 申请公布日期 1983.01.04
申请号 CA19790321821 申请日期 1979.02.16
申请人 GENERAL ELECTRIC COMPANY 发明人 HOUSTON, DOUGLAS E.
分类号 H01L23/48;(IPC1-7):H01L23/48 主分类号 H01L23/48
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