发明名称 TEMPERATURE CONTROLLED SUBSTRATE PROCESSING
摘要 A semiconductor processing system includes a vacuum chamber, a gas source configured to supply a gas to the chamber, a platen having a top surface in the chamber to support a substrate, the platen including a conductive plate, a robot to transport the substrate onto and off of the platen, a first plurality of lamps disposed below the top surface of the platen to heat the platen, and an RF power source to generate a plasma in the chamber above the platen.
申请公布号 WO2017004050(A1) 申请公布日期 2017.01.05
申请号 WO2016US39834 申请日期 2016.06.28
申请人 APPLIED MATERIALS, INC. 发明人 SWAMINATHAN, Bharath;NG, Eric;PATIBANDLA, Nag B.;NG, Hou T.;KUMAR, Ashavani;JOSHI, Ajey M.;FREY, Bernard;KRISHNAN, Kasiraman
分类号 H01L21/02;H01L21/205;H01L21/67;H05H1/46 主分类号 H01L21/02
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