发明名称 SYNTHETIC TEST CIRCUIT FOR VALVE PERFORMANCE TEST OF HVDC
摘要 Disclosed is a synthetic test circuit for a valve performance test of HVDC. The synthetic test circuit comprises a resonance circuit configured to comprise a first test valve to test an operation of an inverter mode and a second test valve to test an operation of a rectifier mode. The synthetic test circuit comprises a power supply (P/S) configured to provide the resonance circuit with an operating voltage. The synthetic test circuit comprises a DC/DC converter configured to bypass a DC offset current of the resonance circuit. The first test valve is an inverter unit (INV), which has a positive DC current offset. Further, the second test valve is a rectifier unit (REC), which has a negative DC current offset.
申请公布号 EP3112886(A1) 申请公布日期 2017.01.04
申请号 EP20160169381 申请日期 2016.05.12
申请人 LSIS Co., Ltd.;Pukyong National University Industry-University Cooperation foundation 发明人 BAEK, Seung Taek;NHO, Eui Cheol;JUNG, Jae Hun;LEE, Jin Hee;CHUNG, Yong Ho
分类号 G01R31/333 主分类号 G01R31/333
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