发明名称 |
Developing apparatus and developing method |
摘要 |
According to one embodiment, a developing apparatus and method comprises moving a first nozzle from a scan start position to a scan end position, with holding a second nozzle for supplying a rinse solution to be adjacent to the scan start position for the first nozzle, while supplying a developing solution from the first nozzle onto a wafer being rotated; and supplying the rinse solution from the second nozzle onto the wafer being rotated. |
申请公布号 |
US9535328(B2) |
申请公布日期 |
2017.01.03 |
申请号 |
US201414341920 |
申请日期 |
2014.07.28 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Takeishi Tomoyuki |
分类号 |
G03B27/32;G03F7/30;G03F7/40;H01L21/67 |
主分类号 |
G03B27/32 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A developing apparatus comprising:
a wafer holder to hold a wafer; a rotating unit that rotates the wafer holder; a first nozzle to supply a developing solution onto the wafer; a second nozzle to supply a rinse solution onto the wafer; a nozzle guide that guides the first nozzle so as to be able to linearly scan directly above the wafer while holding the second nozzle in a position directly above the wafer to be adjacent to a scan start position for the first nozzle; a first nozzle driver that drives the first nozzle while having the nozzle guide lead the first nozzle; and a first nozzle drive control unit that drives and controls the first nozzle to move from the scan start position to a scan end position while supplying the developing solution onto the wafer. |
地址 |
Minato-ku JP |