发明名称 Developing apparatus and developing method
摘要 According to one embodiment, a developing apparatus and method comprises moving a first nozzle from a scan start position to a scan end position, with holding a second nozzle for supplying a rinse solution to be adjacent to the scan start position for the first nozzle, while supplying a developing solution from the first nozzle onto a wafer being rotated; and supplying the rinse solution from the second nozzle onto the wafer being rotated.
申请公布号 US9535328(B2) 申请公布日期 2017.01.03
申请号 US201414341920 申请日期 2014.07.28
申请人 Kabushiki Kaisha Toshiba 发明人 Takeishi Tomoyuki
分类号 G03B27/32;G03F7/30;G03F7/40;H01L21/67 主分类号 G03B27/32
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A developing apparatus comprising: a wafer holder to hold a wafer; a rotating unit that rotates the wafer holder; a first nozzle to supply a developing solution onto the wafer; a second nozzle to supply a rinse solution onto the wafer; a nozzle guide that guides the first nozzle so as to be able to linearly scan directly above the wafer while holding the second nozzle in a position directly above the wafer to be adjacent to a scan start position for the first nozzle; a first nozzle driver that drives the first nozzle while having the nozzle guide lead the first nozzle; and a first nozzle drive control unit that drives and controls the first nozzle to move from the scan start position to a scan end position while supplying the developing solution onto the wafer.
地址 Minato-ku JP