Systems and Methods for Automated, Rapid Detection of High-Atomic-Number Materials

摘要

The present invention is directed to an inspection system that has a radiation source, a detector array, an inspection region, and a processing unit, where the processing unit a) obtains a radiographic image, b) segments the radiographic image based on radiation attenuation or transmission, c) identifies at least one segmented area on the radiographic image, d) filters the at least one segmented area using at least one geometric filter, e) generates feature vectors using the filtered segmented area; and f) compares the feature vectors against predefined values to determine whether a high-atomic-number object is present.

主权项

1. An inspection system comprising:
a. a radiation source; b. a detector array; c. an inspection region bounded by said radiation source and detector array; d. a processing unit, wherein, through operation of at least one processor, at least one memory, and programmatic instructions, said processing unit
i. obtains data representative of a radiographic image;ii. segments said data based on radiation attenuation or transmission;iii. identifies at least one segmented area within said data representative of said radiographic image;iv. filters said at least one segmented area using at least one geometric filter;v. generates a plurality of feature vectors using said filtered segmented area; andvi. compares said feature vectors against predefined values to determine whether a high-atomic-number object is present.