发明名称 半導体装置
摘要 A memory array (101) includes a plurality of twin cells (104), each of which is composed of a first memory element (102) and a second memory element (103) which are each electrically rewritable and configured to memorize binary data according to a difference in threshold voltages therebetween. A power supply control circuit (105), upon receiving a request for erasing data in a twin cell, increases both the threshold voltage of the first memory element (102) and the threshold voltage of the second memory element (103) during the pre-writing, and after the pre-writing, differentiates the voltage of a first bit line (BL) which is connected to the first memory element (102) and the voltage of a second bit line (/BL) which is connected to the second memory element (103) during the application of erase pulse.
申请公布号 JP6035422(B2) 申请公布日期 2016.11.30
申请号 JP20150531707 申请日期 2013.08.15
申请人 ルネサスエレクトロニクス株式会社 发明人 加藤 多実結
分类号 G11C16/02;G11C16/04 主分类号 G11C16/02
代理机构 代理人
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