发明名称 |
TRANSMITTER CONFIGURED FOR TEST SIGNAL INJECTION TO TEST AC-COUPLED INTERCONNECT |
摘要 |
In one example, a driver circuit includes a differential transistor pair (504) configured to be biased by a current source (502) and including a differential input (516) and a differential output (512). The driver circuit further includes a resistor pair (506) coupled between a node pair and the differential output, a transistor pair coupled between a voltage supply and the node pair, and a bridge transistor coupled between the node pair. The driver circuit further includes a pair of three-state circuit elements (510) having a respective pair of input ports, a respective pair of control ports, and a respective pair of output ports. The pair of output ports is respectively coupled to the node pair. The pair of control ports is coupled to a common node comprising each gate of the transistor pair and a gate of the bridge transistor. |
申请公布号 |
WO2016186930(A1) |
申请公布日期 |
2016.11.24 |
申请号 |
WO2016US31919 |
申请日期 |
2016.05.11 |
申请人 |
XILINX, INC. |
发明人 |
MCLEOD, Scott, D.;IM, Hsung, Jai;CHEN, Stanley, Y. |
分类号 |
G01R31/3185;H03K5/00 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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