SYSTEM FOR DETECTION AND IMAGING BY SPECTRAL ANALYSIS IN SEVERAL WAVELENGTH BANDS

摘要

The invention relates to a system for detection and infrared imaging by spectral analysis in several wavelength bands comprising: —an imaging sensor comprising a plurality of elementary sensors together forming a matrix sensitive surface; —an imaging optic adapted for forming on the sensitive surface of the imaging sensor, a first image of the scene to be analysed in a first wavelength band, and at least one second image of the scene to be analysed in a second wavelength band, characterized in that said detection and imaging system furthermore comprises an optical device consisting of a fixed optical plate adapted for shifting the first image with respect to the second image in the plane of the sensitive surface, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the spacing of the elementary sensors of the matrix sensitive surface along this direction or to a multiple of this spacing.

主权项

1. An infrared imaging and detection system by spectral analysis in several bands of wavelengths including:
an imaging sensor including a plurality of elementary sensors forming together a matrix sensitive surface; an imaging optics adapted for forming on the sensitive surface of the imaging sensor, a first image (Pb1) of the scene to be analyzed in a first band of wavelengths (B1), and at least one second image (Pb2) of the scene to be analyzed in a second band of wavelengths (B2), an optical device adapted for shifting the first image (Pb1) relatively to the second image (Pb2) in the plane of the sensitive surface,
the infrared imaging and detection system wherein the optical device adapted for shifting the first image (Pb1) relatively to the second image (Pb2) in the plane of the sensitive surface consists of a single fixed optical plate with parallel faces, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the distance (p, dd) between two elementary sensors of the matrix sensitive surface along this direction or to a multiple of this distance, the imaging optics being an optical focusing system, the single fixed optical plate with parallel faces being positioned between the imaging optics and the imaging sensor.