发明名称 |
THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF |
摘要 |
A thin film transistor (TFT) includes a semiconductive layer, a first inter-layer drain (ILD) layer, a second ILD layer, and at least one contact hole passing through the first ILD layer and the second ILD layer. The semiconductive layer includes a channel region, a first lightly doped drain (LDD) region, a second LDD region, a first heavily doped drain (HDD) region, and a second HDD region. The at least one contact hole includes a first portion passing through the second ILD layer and a second portion passing through the first ILD layer. The second portion gradually narrows along a direction from a top to a bottom of the first ILD layer. |
申请公布号 |
US2016293770(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
US201514718951 |
申请日期 |
2015.05.21 |
申请人 |
CENTURY TECHNOLOGY (SHENZHEN) CORPORATION LIMITED |
发明人 |
PENG YU-CHING |
分类号 |
H01L29/786;H01L21/265;H01L29/66;H01L21/311;H01L29/08;H01L29/417 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A thin film transistor (TFT) comprising:
a substrate; a semiconductive layer located on the substrate and comprising a channel region, a first lightly doped drain (LDD) region and a second LDD region respectively located at opposite sides of the channel region, a first heavily doped drain (HDD) region located at a side of the first LDD region away from the channel region, and a second HDD region located at a side of the second LDD region away from the channel region; a first inter-layer drain (ILD) layer located on the semiconductive layer; a second ILD layer located on the first ILD layer; and at least one contact hole passing through the first ILD layer and the second ILD layer, the at least one contact hole comprising a first portion passing through the second ILD layer and a second portion passing through the first ILD layer, wherein the second portion gradually narrows along a direction from a top to a bottom of the first ILD layer; a cross-sectional view of the first portion is rectangular, and a cross-sectional view of the second portion is trapezoidal; the first portion has a same size along a direction from a top to a bottom of the second ILD layer; a projected area of the first portion projected on the substrate is greater than an area of the first HDD region. |
地址 |
Shenzhen CN |