发明名称 CONTACT FOR HIGH-K METAL GATE DEVICE
摘要 An integrated circuit having an improved gate contact and a method of making the circuit are provided. In an exemplary embodiment, the method includes receiving a substrate. The substrate includes a gate stack disposed on the substrate and an interlayer dielectric disposed on the gate stack. The interlayer dielectric is first etched to expose a portion of the gate electrode, and then the exposed portion of the gate electrode is etched to form a cavity. The cavity is shaped such that a portion of the gate electrode overhangs the electrode. A conductive material is deposited within the cavity and in electrical contact with the gate electrode. In some such embodiments, the etching of the gate electrode forms a curvilinear surface of the gate electrode that defines the cavity.
申请公布号 US2016293721(A1) 申请公布日期 2016.10.06
申请号 US201615180847 申请日期 2016.06.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Chuang Harry-Hak-Lay;Lin Huan-Just
分类号 H01L29/423;H01L21/768;H01L21/3213;H01L21/8238;H01L21/311;H01L29/78;H01L23/528 主分类号 H01L29/423
代理机构 代理人
主权项 1. An integrated circuit comprising: a device gate disposed on a substrate, wherein the device gate includes: an interfacial layer disposed on the substrate;a dielectric material disposed on the interfacial layer; anda gate electrode disposed on the dielectric material; and a contact extending into and conductively coupled to the gate electrode, wherein the contact is shaped such that a portion of the gate electrode is disposed on the contact opposite the substrate.
地址 Hsin-Chu TW