发明名称 |
CONTACT FOR HIGH-K METAL GATE DEVICE |
摘要 |
An integrated circuit having an improved gate contact and a method of making the circuit are provided. In an exemplary embodiment, the method includes receiving a substrate. The substrate includes a gate stack disposed on the substrate and an interlayer dielectric disposed on the gate stack. The interlayer dielectric is first etched to expose a portion of the gate electrode, and then the exposed portion of the gate electrode is etched to form a cavity. The cavity is shaped such that a portion of the gate electrode overhangs the electrode. A conductive material is deposited within the cavity and in electrical contact with the gate electrode. In some such embodiments, the etching of the gate electrode forms a curvilinear surface of the gate electrode that defines the cavity. |
申请公布号 |
US2016293721(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
US201615180847 |
申请日期 |
2016.06.13 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Chuang Harry-Hak-Lay;Lin Huan-Just |
分类号 |
H01L29/423;H01L21/768;H01L21/3213;H01L21/8238;H01L21/311;H01L29/78;H01L23/528 |
主分类号 |
H01L29/423 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated circuit comprising:
a device gate disposed on a substrate, wherein the device gate includes:
an interfacial layer disposed on the substrate;a dielectric material disposed on the interfacial layer; anda gate electrode disposed on the dielectric material; and a contact extending into and conductively coupled to the gate electrode, wherein the contact is shaped such that a portion of the gate electrode is disposed on the contact opposite the substrate. |
地址 |
Hsin-Chu TW |