METHOD AND APPARATUS FOR OPTIMIZED MEMORY TEST STATUS DETECTION AND DEBUG

摘要

Embodiments contained in the disclosure provide a method for memory built-in self-testing (MBIST). The method begins when a testing program is loaded, which may be from an MBIST controller. Once the testing program is loaded MBIST testing begins. During testing, memory failures are determined and written to a failure indicator register. The writing to the failure indicator register occurs in parallel with the ongoing MBIST testing. An apparatus is also provided. The apparatus includes a memory data read/write block, a memory register, a memory addressor, and a memory read/write controller. The apparatus communicates with the memories under test through a memory address and data bus.

主权项

1. A method of memory built-in self-testing (MBIST), comprising:
loading a testing program; testing memories using the testing program; determining if any memory is failing; and writing to a failure indicator register in parallel with ongoing testing if any memory is failing.