发明名称 INDUCTIVE MEASURING PROBE AND METHOD FOR OPERATING AN INDUCTIVE MEASURING PROBE
摘要 The invention proposes an inductive measuring probe and a method for operating the measuring probe. The measuring probe is equipped with a movably arranged probe element, with a sensor (1) having a coil arrangement (14) and a core (15) which is arranged such that it can be displaced in relation to the coil arrangement (14) and which is connected to the probe element, wherein the sensor (1) converts a deflection of the probe element into an analog measurement signal, with an electrical reference component (2) which converts an analog input voltage into an analog output voltage, with a drive device which generates an identical analog input voltage for the sensor (1) and the reference component (2), with a processing device which determines the influence of disturbing effects from the analog output voltage of the reference component (2), and which determines a measurement result from the measurement signal and the influence of disturbing effects.
申请公布号 EP3074726(A1) 申请公布日期 2016.10.05
申请号 EP20140830501 申请日期 2014.11.25
申请人 ADDI-DATA GMBH 发明人 SOHLER, JEAN-LOUIS;OHLMANN, RENÉ
分类号 G01D5/22;G01D5/244 主分类号 G01D5/22
代理机构 代理人
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