发明名称 |
TRANSMISSION CIRCUIT, SEMICONDUCTOR DEVICE, AND DATA TRANSMISSION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To suppress the trouble in the electrostatic breakdown test.SOLUTION: A transmission circuit according to an embodiment includes a pulse generation circuit that generates pulse signals based on edges of input data, a first output driver that outputs a first output pulse signal related to one of the edges to a first end of an external insulating coupling element on the basis of the pulse signal, a second output driver that outputs a second output pulse signal related to the other edge to a second end of the insulating coupling element on the basis of the pulse signal, and an output stop circuit that stops the output of the first and second output pulse signals for a predetermined period after the activation of the power source voltage.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016174346(A) |
申请公布日期 |
2016.09.29 |
申请号 |
JP20150180395 |
申请日期 |
2015.09.14 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
TAKEDA KOICHI;NAGASE HIROKAZU;WATABE SHINPEI |
分类号 |
H03K17/687;H01L21/822;H01L27/04;H03K17/22;H04L25/02 |
主分类号 |
H03K17/687 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|