发明名称 試験装置
摘要 PROBLEM TO BE SOLVED: To provide a test device for preventing software setting from being complicated and a setting error from being caused by allowing an external analyzer to easily perform system setting being the same as that of a controller without requiring complicated software setting in the external analyzer when an operation and monitoring are performed from the external analyzer.SOLUTION: A test device includes: a test device body 12 for performing a test; a controller 32 for performing the setting and execution of a test condition, etc. and the collection of test data with respect to the test device body 12; and an external analyzer 42 connected to the controller 32 in order to perform a test operation and monitoring. System setting information of the controller 32 is transferred from the controller 32 to the external analyzer 42. The external analyzer 42 acquires system setting information of the external analyzer 42 on the basis of the system setting information transferred from the controller 32.
申请公布号 JP5999979(B2) 申请公布日期 2016.09.28
申请号 JP20120115102 申请日期 2012.05.18
申请人 株式会社鷺宮製作所 发明人 中條 崇
分类号 G01N3/04;G01N3/08;G01N3/34 主分类号 G01N3/04
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