发明名称 DRYING APPARATUS FOR SEMICONDUCTOR WAFER
摘要 According to the present invention, provided is an apparatus for drying a semiconductor wafer. The apparatus for drying a semiconductor wafer includes: a chamber; a stage rotating a wafer inside the chamber; an air injection unit facing the upper surface of the wafer inside the chamber to discharge air downwards; and a side exhaustion line installed in a side wall of the chamber to exhaust the air. The air injection unit forms an air flow of a laminar flow toward the wafer.
申请公布号 KR20160110323(A) 申请公布日期 2016.09.21
申请号 KR20160113968 申请日期 2016.09.05
申请人 RION CO., LTD. 发明人 PARK, KI WOONG;CHUNG, KU CHAN
分类号 H01L21/02;H01L21/60;H01L21/67;H01L21/683;H01L21/687 主分类号 H01L21/02
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