发明名称 三次元形状測定装置、三次元形状測定方法、及びプログラム
摘要 Pattern lights A and B of which patterns respectively having bright and dark sections have been in an inverted relation are projected on a subject to calculate luminance distributions L1 and L2 of the subject and average values Ave(L1) and Ave(L2) of the distributions. A luminance distribution obtained by multiplying a luminance distribution L0 of the subject of only a natural light component by a coefficient eta is subtracted from the luminance distribution L2 obtained by projecting the pattern light B on the subject and a correction value L2' thereof is calculated so that a difference e of the average values become zero. Then, an intersection point of the luminance distribution L1 obtained by projecting the pattern light A on the subject and the correction value L2' of the luminance distribution L2 obtained by projecting the pattern light B on the subject is derived.
申请公布号 JP5995484(B2) 申请公布日期 2016.09.21
申请号 JP20120080161 申请日期 2012.03.30
申请人 キヤノン株式会社 发明人 安藤 利典
分类号 G01B11/25 主分类号 G01B11/25
代理机构 代理人
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