发明名称 MODIFIED TUNGSTEN SILICON
摘要 A method for forming a precision resistor or an e-fuse structure where tungsten silicon is used. The tungsten silicon layer is modified by implanting nitrogen into the structure.
申请公布号 US2016240478(A1) 申请公布日期 2016.08.18
申请号 US201514623115 申请日期 2015.02.16
申请人 GLOBALFOUNDRIES INC. 发明人 Ferrer Domingo A.;Kohli Kriteshwar K.;Krishnan Siddarth A.;Shepard, JR. Joseph F.;Wong Keith Kwong Hon
分类号 H01L23/525;H01L27/112 主分类号 H01L23/525
代理机构 代理人
主权项 1. A method of forming a semiconductor structure, the method comprising: forming a tungsten silicon layer on an insulator, wherein the tungsten silicon layer comprises tungsten and silicon; introducing nitrogen into the tungsten silicon layer to form a nitrogen-containing tungsten silicon layer, wherein the nitrogen-containing silicon layer contains nitrogen, wherein a concentration of nitrogen in the nitrogen-containing silicon layer is at least 1 mole %; and forming a first conductive material and a second conductive material on the tungsten silicon layer, wherein the nitrogen-containing tungsten silicon layer forms an electrical connection between the first conductive material and the second conductive material.
地址 Ugland House KY