发明名称 Screwless contact spring exchange
摘要 A contact spring block for a sequential test of electronic components comprises: a base block, a group of single contact springs, and a clip-on device: The group of single contact springs is clamped and aligned when the clip-on device is clipped to the base block.
申请公布号 EP2866036(B1) 申请公布日期 2016.08.10
申请号 EP20130190519 申请日期 2013.10.28
申请人 MULTITEST ELEKTRONISCHE SYSTEME GMBH 发明人 LEIKERMOSER, VOLKER;STANISZEWSKI, GERALD
分类号 G01R1/04;H05K7/10 主分类号 G01R1/04
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