| 摘要 |
PROBLEM TO BE SOLVED: To provide a technology capable of highly accurately measuring electrostatic capacitance of each input surface, regarding measurement of the electrostatic capacitance in the input surfaces provided in an input apparatus.SOLUTION: A silicon rubber sheet 52 of a high dielectric constant body which has a specific dielectric constant higher than air and can be deformed more easily than an input surface 22 of an input apparatus 20, is held between a measuring electrode 51 formed from a conductive material and the input surface 22. In such a state, electrostatic capacitance of the input surface 22 is detected as a detected capacitance value by a detection electrode 23 and an input control section 25 of the input apparatus 20. The silicon rubber sheet 52 is adhered to a measuring surface 51a of the measuring electrode 51 and the input surface 22, respectively, thereby avoiding the situation where a layer of air is generated between the surfaces 51a, 22. Therefore, variance in the detected capacitance values caused by the layer of air is reduced and measurement accuracy can be improved. |
