发明名称 METHOD TO FABRICATE QUANTUM DOT FIELD-EFFECT TRANSISTORS WITHOUT BIAS-STRESS EFFECT
摘要 Disclosed herein are embodiments of a method to form quantum dot field-effect transistors (QD FETs) having little to no bias-stress effect. Bias-stress effect can be reduced or eliminated through, as an example, the use of a gas or liquid to remove ligands and/or reduce charge trapping on the QD FETs, followed by deposition of an inorganic or organic matrix around the QDs in the FET.
申请公布号 US2016181407(A1) 申请公布日期 2016.06.23
申请号 US201514973522 申请日期 2015.12.17
申请人 The Regents of the University of California 发明人 Law Matt;Tolentino Jason
分类号 H01L29/66;H01L29/778;H01L29/15 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for reducing or eliminating bias-stress effect in a quantum dot field-effect transistor (QD FET), the method comprising: exposing at least one quantum dot in a QD FET to a substance, wherein the substance is configured to modify a surface of the at least one quantum dot to reduce charge trapping and/or ion motion, thereby reducing or eliminating bias-stress effect in the QD FET.
地址 Oakland CA US