发明名称 |
METHOD TO FABRICATE QUANTUM DOT FIELD-EFFECT TRANSISTORS WITHOUT BIAS-STRESS EFFECT |
摘要 |
Disclosed herein are embodiments of a method to form quantum dot field-effect transistors (QD FETs) having little to no bias-stress effect. Bias-stress effect can be reduced or eliminated through, as an example, the use of a gas or liquid to remove ligands and/or reduce charge trapping on the QD FETs, followed by deposition of an inorganic or organic matrix around the QDs in the FET. |
申请公布号 |
US2016181407(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201514973522 |
申请日期 |
2015.12.17 |
申请人 |
The Regents of the University of California |
发明人 |
Law Matt;Tolentino Jason |
分类号 |
H01L29/66;H01L29/778;H01L29/15 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for reducing or eliminating bias-stress effect in a quantum dot field-effect transistor (QD FET), the method comprising:
exposing at least one quantum dot in a QD FET to a substance, wherein the substance is configured to modify a surface of the at least one quantum dot to reduce charge trapping and/or ion motion, thereby reducing or eliminating bias-stress effect in the QD FET. |
地址 |
Oakland CA US |