发明名称 |
ULTRAHIGH VOLTAGE RESISTOR, SEMICONDUCTOR DEVICE, AND THE MANUFACTURING METHOD THEREOF |
摘要 |
An example provides a semiconductor device including an insulator with a predetermined thickness between a well region of a semiconductor substrate and a resistor of polysilicon. The insulator has a structure that is able to withstand an ultrahigh voltage, and thereby allows the manufacture of a semiconductor device resistor that can bear an ultrahigh voltage without increasing the size of a semiconductor substrate and a semiconductor device including such a resistor. Other examples provide a method for manufacturing such a semiconductor device. |
申请公布号 |
US2016181351(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201514944550 |
申请日期 |
2015.11.18 |
申请人 |
Magnachip Semiconductor, Ltd. |
发明人 |
KIM Kwang Il;KIM Young Bae |
分类号 |
H01L49/02;H01L29/10;H01L27/06;H01L29/78;H01L21/02;H01L27/02 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a high voltage resistor comprising:
forming a well region on a semiconductor substrate; forming a first insulator layer on a surface of the well region; forming a second insulator layer on a surface of the first insulator layer; and forming a polysilicon layer on a surface of the second insulator layer, wherein a first sloped side region is included when forming the first insulator layer, and a second sloped side region is included when forming the second insulator layer. |
地址 |
Cheongju-si KR |