发明名称 ULTRAHIGH VOLTAGE RESISTOR, SEMICONDUCTOR DEVICE, AND THE MANUFACTURING METHOD THEREOF
摘要 An example provides a semiconductor device including an insulator with a predetermined thickness between a well region of a semiconductor substrate and a resistor of polysilicon. The insulator has a structure that is able to withstand an ultrahigh voltage, and thereby allows the manufacture of a semiconductor device resistor that can bear an ultrahigh voltage without increasing the size of a semiconductor substrate and a semiconductor device including such a resistor. Other examples provide a method for manufacturing such a semiconductor device.
申请公布号 US2016181351(A1) 申请公布日期 2016.06.23
申请号 US201514944550 申请日期 2015.11.18
申请人 Magnachip Semiconductor, Ltd. 发明人 KIM Kwang Il;KIM Young Bae
分类号 H01L49/02;H01L29/10;H01L27/06;H01L29/78;H01L21/02;H01L27/02 主分类号 H01L49/02
代理机构 代理人
主权项 1. A method for manufacturing a high voltage resistor comprising: forming a well region on a semiconductor substrate; forming a first insulator layer on a surface of the well region; forming a second insulator layer on a surface of the first insulator layer; and forming a polysilicon layer on a surface of the second insulator layer, wherein a first sloped side region is included when forming the first insulator layer, and a second sloped side region is included when forming the second insulator layer.
地址 Cheongju-si KR