发明名称 |
PATTERN FORMATION METHOD, COMPOSITION FOR PROTECTIVE FILM FORMATION, AND METHOD FOR PRODUCING ELECTRONIC DEVICE |
摘要 |
A pattern formation method including: (a) a step for applying a coating of an actinic ray-sensitive or a radiation-sensitive resin composition onto a substrate, and forming an actinic ray-sensitive or a radiation-sensitive film; (b) a step for applying a coating of a composition for protective film formation onto the actinic ray-sensitive or radiation-sensitive film, and forming a protective film; (c) a step for causing the actinic ray-sensitive or radiation-sensitive film coated with the protective film to be exposed to light; and (d) a step for developing the exposed actinic ray-sensitive or radiation-sensitive film with a developer containing an organic solvent. The protective film contains a resin (X) having a proton acceptor functional group. |
申请公布号 |
WO2016098809(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
WO2015JP85206 |
申请日期 |
2015.12.16 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
TANGO, NAOHIRO;INOUE, NAOKI;YAMAMOTO, KEI;SHIRAKAWA, MICHIHIRO;GOTO, AKIYOSHI |
分类号 |
G03F7/11;C08F220/34;G03F7/32;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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