| 摘要 |
The subject of the invention provides a calibration sample and a fluorescence X-ray analytical device and method, provides a calibration sample for analyzing fluorescence X-ray of a liquid sample, can be used for a long time and can perform accurate difference calibration. A calibration sample of the invention is a solid calibration sample which can be used for calibrating and analyzing change of measurement X-ray intensity of object metal elements as time goes, wherein metal layers of object metal elements and light element layers with thickness of more than 1mm are overlapped; in the light element layers, at least one light element selected from the group of hydrogen, boron, carbon, nitrogen, oxygen and fluorine possesses a largest Moore number; in the metal layers, a surface of an opposite side relative to the light element layers is an analytical layer. |
