发明名称 A COMPUTING DEVICE EXECUTABLE FOR A PROGRAM PERFORMING A METHOD FOR ANALYSING POWER NOISE IN A SEMICONDUCTOR DEVICE, A METHOD INCLUDING THE SAME FOR DESIGNING A SEMICONDUCTOR DEVICE, AND A PROGRAM STRORAGE MEDIUM STORING THE PROGRAM
摘要 A method for analyzing power noise in a semiconductor device according to the embodiment of the present invention includes a step of correcting present current information by using a previous analysis result and generating correct current information, a step of renewing a current vector according to the correct current information, and a step of calculating a voltage vector by using the renewed current vector and generating the present analysis result. So, more accurate power noise can be analyzed.
申请公布号 KR20160068435(A) 申请公布日期 2016.06.15
申请号 KR20140174202 申请日期 2014.12.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHEON, YOUNG HOE;HWANG, CHAN SEOK
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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