发明名称 |
A COMPUTING DEVICE EXECUTABLE FOR A PROGRAM PERFORMING A METHOD FOR ANALYSING POWER NOISE IN A SEMICONDUCTOR DEVICE, A METHOD INCLUDING THE SAME FOR DESIGNING A SEMICONDUCTOR DEVICE, AND A PROGRAM STRORAGE MEDIUM STORING THE PROGRAM |
摘要 |
A method for analyzing power noise in a semiconductor device according to the embodiment of the present invention includes a step of correcting present current information by using a previous analysis result and generating correct current information, a step of renewing a current vector according to the correct current information, and a step of calculating a voltage vector by using the renewed current vector and generating the present analysis result. So, more accurate power noise can be analyzed. |
申请公布号 |
KR20160068435(A) |
申请公布日期 |
2016.06.15 |
申请号 |
KR20140174202 |
申请日期 |
2014.12.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHEON, YOUNG HOE;HWANG, CHAN SEOK |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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