| 摘要 |
The present invention relates to a method for determining basic shim settings of a magnetic resonance device, a calculating unit, a computer program product, the magnetic resonance device and a system. Suggested is the method for determining the basic shim settings of the magnetic resonance device for enabling an improved calculation of the basic shim settings of the magnetic resonance device. The basic shim settings include spatial distribution of multiple shim elements. The method includes the following methodological steps of: setting up an optimization function which includes multiple optimization parameters, wherein a first optimization parameter among the optimization parameters includes a homogeneity value of B0 distribution inside the magnetic resonance device established with the basic shim settings while a second optimization parameter among the optimization parameters includes a force value exerted on the shim elements; calculating the spatial distribution of the shim elements taking into account the first optimization parameter and the second optimization parameter in order to minimize the optimization function; and determining the basic shim settings of the magnetic resonance device by using the calculated spatial distribution of the shim elements. |
