| 摘要 |
The present invention concerns a method for analysing, by flight time mass spectrometry, a solid sample comprising an organic layer, comprising the following steps: a. injecting, into a vacuum chamber of an ionisation source where said sample is placed, a carrier gas stream consisting of pure helium at low pressure; b. applying, between the electrodes of the ionisation source, an electrical discharge, to generate, in said vacuum chamber, a low pressure helium plasma; c. exposing said organic layer of the sample to said low pressure helium plasma in such a way as to produce, in said low pressure helium plasma, at least one ionised elementary, molecular and/or isotopic species, originating from said organic layer of the sample; d. extracting, by flight time mass spectrometry, a spectrometric signal representative of at least one ionised elementary, molecular and/or isotopic species, originating from said organic layer of the sample. |
