发明名称 |
Method for manufacturing a semiconductor structure, semiconductor structure, and electronic device |
摘要 |
A method for manufacturing a semiconductor structure 1 comprises: providing a substrate 2 including a first semiconductor material; forming a dielectric layer 3 on a surface of the substrate 2; forming an opening in the dielectric layer 3 having a bottom reaching the substrate 2; providing a second semiconductor material 7B in the opening and on the substrate 2, the second semiconductor material 7B being encapsulated by a further dielectric material 6 forming a filled cavity; melting the second semiconductor material 7B in the cavity; recrystallizing the second semiconductor material 7B in the cavity; laterally removing the second semiconductor material 7B at least partially for forming a lateral surface at the second semiconductor material 7B; and forming a third semiconductor material 11 on the lateral surface of the second semiconductor material 7B. Also disclosed is the semiconductor structure 1 produced by the above method. The invention seeks to form compound semiconductor layers on silicon substrates without lattice mismatch deformations. |
申请公布号 |
GB2532786(A) |
申请公布日期 |
2016.06.01 |
申请号 |
GB20140021182 |
申请日期 |
2014.11.28 |
申请人 |
International Business Machines Corporation |
发明人 |
Mattias Bengt Borg;Kirsten Emilie Moselund;Heike E. Riel;Heinz Schmid |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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