| 摘要 |
PROBLEM TO BE SOLVED: To provide a sample holder tip and a sample holder capable of further expanding an inclination angle by utilizing a space between pole pieces.SOLUTION: The sample holder tip includes: a sample installation pedestal; a sample fixing part which fixes a sample; and a fulcrum for being connected to a link member. When a position of a sample surface is arranged on a focal surface of an electron beam, the fulcrum is provided on the surface except the sample surface. Moreover, in a preferable embodiment of the sample holder tip, the fulcrum exists on an axis except a holder axis of the sample holder. |
