A measuring probe, an apparatus and a method for label free attenuated reflection infrared spectroscopy

摘要

The present invention relates to a measuring probe for infrared spectroscopy, said measuring probe having an elongated form with a first end for coupling and decoupling infrared light into and out of the measuring probe and a second end. The measuring probe comprises an ATR prism arranged at the second end of the measuring probe. The ATR prism has at least one first surface having at least one measuring portion configured to be brought in optical contact with a measured object, at least one second surface having at least one reflective portion, and a cutting portion (53; 54) for cutting through the measured object, said cutting portion having a cutting tip or cutting blade with a cutting angle of equal to or less than 60°. The ATR prism is configured so that at least a portion of the infrared light entering the measuring probe undergoes an attenuated total reflection at the least one measuring portion of the first surface, at least a portion of the totally reflected light is reflected back towards the first surface by the at least one reflective portion of the second surface, and at least a portion of the light reflected back by the at least one reflective portion of the second surface undergoes an attenuated total reflection at the at least one measuring portion of the first surface and is decoupled from the ATR prism. The invention relates further to an apparatus for infrared spectroscopy comprising the measuring probe and a method for infrared spectroscopy.