High resolution imaging devices with wide field and extended focus

摘要

Embodiments of the present invention relate to a high-resolution imaging device with wide field and extended focus comprising a beam generator for generating a plurality of nondiffracting beams and a scanning mechanism for moving the plurality of nondiffracting beams relative to the object to illuminate a volume of the object. The high-resolution imaging device also comprises surface element and a body having a light detector layer outside the surface element. The light detector layer has a light detector configured to measure light data associated with the plurality of nondiffracting beams illuminating the volume of the object. In some cases, the high-resolution imaging device also includes a lens inside of the light detector layer. The lens is configured to focus the light on the light detector surface.

主权项

1. A high resolution imaging device with wide field and extended focus, comprising:
a body comprising a light detector layer outside a transparent surface element; a beam generator having a beam generator surface, the beam generator configured to generate a plurality of nondiffracting beams, each nondiffracting beam having a substantially constant spot size and a beam length, wherein each nondiffracting beam is configured to propagate imaging illumination along the beam length; a scanning mechanism for moving the plurality of nondiffracting beams through an object being imaged between the beam generator surface and the transparent surface element or moving the object through the plurality of nondiffracting beams in order to propagate the imaging illumination m lengths of the nondiffracting beams through a volume of the object; a light detector in the light detector layer, the light detector configured to receive light incident across the light detector layer and measure light data associated with the plurality of nondiffracting beams illuminating the volume of the object; and a processor configured to generate an image of the object based on the light data measured by the light detector, wherein the image is at a focal plane within the extended depth of focus defined by the beam lengths of the nondiffracting beams.