发明名称 STRUCTURE LIFE DIAGNOSTIC METHOD AND STRUCTURE LIFE DIAGNOSTIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a life diagnostic method capable of enhancing diagnostic accuracy of life of a structure.SOLUTION: The life diagnostic method of a structure according to an embodiment uses a sample test which is configured to press a rigid sphere with a constant test load, to a test piece which is collected from the structure, in an environment of 500°C-900°C, and measures rupture time until the rigid sphere penetrates the test piece, and behavior of deformation of the test piece, and comprises first and second calculation steps. In the first calculation step, equivalent stress in which the rupture time in the sample test and a rupture time by a single axis creep test about a material for forming the structure are equal, is calculated based on the test load, the behavior of deformation, and a database content for associating and storing the test load, equivalent stress of the material, and the behavior of deformation in advance. In the second calculation step, using the rupture time of the sample test corresponding to the calculated equivalent stress, life of the structure is calculated.SELECTED DRAWING: Figure 1
申请公布号 JP2016099132(A) 申请公布日期 2016.05.30
申请号 JP20140233755 申请日期 2014.11.18
申请人 TOSHIBA CORP 发明人 SUZUKI YUSUKE;INUKAI TAKAO;NAKATANI YUJIRO;FUKAMATSU SHOICHI;YAMAYA NOBUO
分类号 G01M99/00;G01N3/00;G01N3/42 主分类号 G01M99/00
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