发明名称 ABNORMALITY UNIT IDENTIFICATION PROGRAM, ABNORMALITY UNIT IDENTIFICATION METHOD AND ABNORMALITY UNIT IDENTIFICATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an abnormality unit identification program, an abnormality unit identification method, and an abnormality unit identification system capable of identifying a unit which has a symptom of abnormality without using any monitoring rule.SOLUTION: The abnormality unit identification program causes a computer to execute a processing including: acquiring a measurement value from each of the plural units which has the identical predetermined item represented by a piece of unit information; calculating a variation amount which represents a difference between the measurement values acquired from each of the plural units and a prediction value of the measurement values based on the previous measurement values of the units; and identifying a unit which has a variation amount different from that of the plural units.SELECTED DRAWING: Figure 6
申请公布号 JP2016095751(A) 申请公布日期 2016.05.26
申请号 JP20140232493 申请日期 2014.11.17
申请人 FUJITSU LTD 发明人 WATANABE KOYO;MATSUMOTO YASUHIDE;KITAJIMA SHINYA
分类号 G05B23/02;G06F11/30 主分类号 G05B23/02
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