发明名称 DEVICE, SYSTEM, METHOD, AND PROGRAM FOR MEASURING CURRENT
摘要 PROBLEM TO BE SOLVED: To enable correction of minute current measured by a usual current sensor for an effect of electromagnetic induction by large current flowing through an adjacent current path.SOLUTION: A current measurement device is connected to current sensors for measuring current flowing through respective current paths, and includes correction means configured to correct a value of current for a first current path to zero when the value of current for the first current path is less than a first threshold value and a value of current for a second current path adjacent to the first current path is greater than a second threshold value that is greater than the first threshold value.SELECTED DRAWING: Figure 1
申请公布号 JP2016095266(A) 申请公布日期 2016.05.26
申请号 JP20140232565 申请日期 2014.11.17
申请人 NEC PLATFORMS LTD 发明人 KOBAYASHI YASUSHI
分类号 G01R19/00;H02B1/40 主分类号 G01R19/00
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