发明名称 APPARATUS, METHOD, AND PROGRAM OF MICROORGANISM INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide an apparatus, a method, and a program of microorganism inspection which are capable of rationalizing a work related to inspection of microorganism.SOLUTION: A microorganism inspection apparatus comprises: an inspection pre-treatment part which, when a content of microorganism inspection to a specific specimen is selected or input, prints an inspection condition of the specific specimen which is read out from a storage device storing inspection information that defines the inspection condition of the specimen on a sheet-like culture medium used in inspection of the specific specimen; and a post-treatment part which, when an image of the culture medium is read in, obtains the inspection condition printed on the culture medium and a type of culture medium which is identifiably displayed in advance on the culture medium from the image, and outputs a determination result of whether or not the inspection condition and the type of the culture medium obtained from the image are conformed.SELECTED DRAWING: Figure 3
申请公布号 JP2016093141(A) 申请公布日期 2016.05.26
申请号 JP20140231905 申请日期 2014.11.14
申请人 JNC CORP 发明人 TERAMURA HAJIME;OSAWA KOZO;KIMURA RYUZO;SATO IKUO
分类号 C12M1/34;C12Q1/04 主分类号 C12M1/34
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