发明名称 |
Semiconductor assembly and method for determining the barrier layer temperature of a semiconductor component |
摘要 |
The semiconductor arrangement (2) has a semiconductor device (6) supported on a carrier (4) with a connecting surface (8). A contact area (12a) is arranged on the carrier. A bonding wire (10) is connected with the connecting surface with the contact area. An independent claim is also included for a method for determining of the junction temperature of a semiconductor device of a semiconductor arrangement. |
申请公布号 |
EP2302673(A3) |
申请公布日期 |
2016.05.25 |
申请号 |
EP20100170772 |
申请日期 |
2010.07.26 |
申请人 |
SEMIKRON ELEKTRONIK GMBH & CO. KG |
发明人 |
SCHULER, STEFAN |
分类号 |
H01L23/34;G01K7/02;H01L21/66;H01L23/544;H01L27/16 |
主分类号 |
H01L23/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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