发明名称 Semiconductor assembly and method for determining the barrier layer temperature of a semiconductor component
摘要 The semiconductor arrangement (2) has a semiconductor device (6) supported on a carrier (4) with a connecting surface (8). A contact area (12a) is arranged on the carrier. A bonding wire (10) is connected with the connecting surface with the contact area. An independent claim is also included for a method for determining of the junction temperature of a semiconductor device of a semiconductor arrangement.
申请公布号 EP2302673(A3) 申请公布日期 2016.05.25
申请号 EP20100170772 申请日期 2010.07.26
申请人 SEMIKRON ELEKTRONIK GMBH & CO. KG 发明人 SCHULER, STEFAN
分类号 H01L23/34;G01K7/02;H01L21/66;H01L23/544;H01L27/16 主分类号 H01L23/34
代理机构 代理人
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