| 摘要 |
A semiconductor device includes a clock buffer and a reference voltage generating part. The clock buffer generates an internal clock signal based on a first and a second clock signal, and generates the internal clock signal based on the first clock signal and a reference signal when a normal operation test is performed in the second operation mode. The reference voltage generation part generates the reference voltage when the normal operation test is performed. So, a burn-in stress test and a normal operation test can be performed. |
