发明名称 PROBE OF ATOMIC-FORCE MICROSCOPE WITH NANOCOMPOSITE RADIATING ELEMENT DOPED BY QUANTUM POINTS AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE
摘要 FIELD: measuring devices.SUBSTANCE: invention relates to measurement equipment and can be used in scanning probe microscopy and atomic force microscopy for diagnosing and studying of nano-sized structures. This invention consists in fact that magnet transparent cantilever is connected with magnet transparent exploring needle, which top is connected with magnet transparent sphere made from glass with through nanometer pores of small and large diameter, filled with quantum points of nucleus-shell and magnetic particles of core-shell structure respectively.EFFECT: enabling simultaneous combination of magnetic, thermal and electromagnetic point effect in optical wave range with measurement of mechanical response to this stimulating effect in one common point of surface of diagnosed object without impacting neighboring sections.2 cl, 2 dwg
申请公布号 RU2584179(C1) 申请公布日期 2016.05.20
申请号 RU20150111584 申请日期 2015.03.30
申请人 FEDERALNOE GOSUDARSTVENNOE BJUDZHETNOE OBRAZOVATELNOE UCHREZHDENIE VYSSHEGO PROFESSIONALNOGO OBRAZOVANIJA "RJAZANSKIJ GOSUDARSTVENNYJ RADIOTEKHNICHESKIJ UNIVERSITET" 发明人 LINKOV VLADIMIR ANATOLEVICH;VISHNJAKOV NIKOLAJ VLADIMIROVICH;LINKOV JURIJ VLADIMIROVICH;LINKOV PAVEL VLADIMIROVICH
分类号 G01Q60/24;B82Y35/00 主分类号 G01Q60/24
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