| 摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor device mounted with a random number generator which can easily and efficiently perform a reliability test of the random number generator.SOLUTION: A memory controller 11 has a self-test processing unit 22 that performs a reliability test of a random number generator 12. The self-test processing unit 22 inputs a predetermined control signal D7 to the random number generator 12 so as to cause the random number generator 12 to generate a random number value D8, and inspects the irreproducibility of the random number D8 generated by the random number generator 12.SELECTED DRAWING: Figure 2 |
