发明名称 SURFACE MEASUREMENT PROBE
摘要 Surface measurement probe (1) comprising: - a hollow probe body (3; 9, 11, 13, 15) extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end; - a retaining arrangement (17, 19, 21; 18, 21) situated inside the probe body and extending along said longitudinal axis, the retaining arrangement (17, 19, 21; 18, 21) being arranged to maintain the surface measurement probe (1) in an assembled state; - a probe tip (7) supported at the distal end of the probe body and arranged to contact a sample; - a bead (31) situated inside the probe body (3) and interposed between the probe tip (7) and the retaining arrangement (17, 19, 2; 18, 21), the bead (31) comprising a thermally-insulating material.
申请公布号 WO2016071296(A1) 申请公布日期 2016.05.12
申请号 WO2015EP75491 申请日期 2015.11.02
申请人 ANTON PAAR TRITEC SA 发明人 BELLATON, BERTRAND;CONTE, MARCELLO
分类号 G01Q30/10;G01N3/42;G01N3/54;G01Q60/36 主分类号 G01Q30/10
代理机构 代理人
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