发明名称 |
Multi-layer metal contacts |
摘要 |
A method for forming metal contacts within a semiconductor device includes forming a first-layer contact into a first dielectric layer that surrounds at least one gate electrode, the first-layer contact extending to a doped region of an underlying substrate. The method further includes forming a second dielectric layer over the first dielectric layer and forming a second-layer contact extending through the second dielectric layer to the first-layer contact. |
申请公布号 |
US9337083(B2) |
申请公布日期 |
2016.05.10 |
申请号 |
US201313911183 |
申请日期 |
2013.06.06 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Shieh Ming-Feng;Tseng Wen-Hung;Lai Chih-Ming;Hsieh Ken-Hsien;Gau Tsai-Sheng;Liu Ru-Gun |
分类号 |
H01L21/283;H01L21/768 |
主分类号 |
H01L21/283 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method for forming metal contacts within a semiconductor device, the method comprising:
forming a hard mask layer directly on opposing sidewalls and a top surface of a gate electrode over a semiconductor substrate, wherein the top surface extends between the opposing sidewalls and the hard mask layer physically contacts the opposing sidewalls and the top surface of the gate electrode; forming a first dielectric layer over the semiconductor substrate such that the first dielectric layer surrounds the gate electrode; forming a temporary dielectric layer over the hard mask layer and the first dielectric layer; forming a trench that extends through the temporary dielectric layer, first dielectric layer, and the hard mask layer, wherein the hard mask layer defines a sidewall of the trench while physically contacting the opposing sidewalls of the gate electrode; forming a first-layer contact in the trench, the first-layer contact extending to a doped source/drain region in the semiconductor substrate; after forming the first-layer contact in the trench, removing the temporary dielectric layer to expose a portion of the hard mask layer, the portion of the hard mask layer covering a top surface of the gate electrode, the top surface of the gate electrode facing away from the semiconductor substrate; forming a second dielectric layer over the first dielectric layer and the portion of the hard mask layer covering the top surface of the gate electrode; and forming a second-layer contact extending through the second dielectric layer to the first-layer contact. |
地址 |
Hsin-Chu TW |