发明名称 INSPECTION SYSTEM AND CONTROL METHOD FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an inspection system and a control method for the same.SOLUTION: An inspection system includes a radiation source 110, an image detector 120, and an uncontrolled device 130 disposed between the radiation source 110 and the image detector 120. Both radiation source 110 and image detector 120 are driven and moved along a schedule route 500. The uncontrolled device 130 includes a placing device for placing at least one object 600 and a rotation mechanism that is coupled with the placing device to rotate the placing device.SELECTED DRAWING: Figure 1
申请公布号 JP2016070909(A) 申请公布日期 2016.05.09
申请号 JP20150018111 申请日期 2015.02.02
申请人 TEST RESEARCH INC 发明人 CHENG YU-CHE;YEN CHIA-HO;CHEN SHIH-LIANG;CHIU CHIH-PIN
分类号 G01N23/04 主分类号 G01N23/04
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