发明名称 Apparatus for metering granular source material in a thin film vapor deposition apparatus
摘要 A metering mechanism (200) is configured for transferring measured doses of a granular material from a first location (100) to a second location (60), and is particularly suited for metering source material in a vapor deposition apparatus (60). A receiver is disposed to receive the granular material from the first location (100). A discharge port is axially offset from an outlet of the receiver. A reciprocating delivery member having a passage defined therethrough is moved in a reciprocating path by a controllable drive device between a load position wherein the passage is aligned with the receiver outlet and a discharge position wherein the passage is aligned with the discharge port. The amount of granular material transferred from the first location (100) to the second location (60) is a function of the volume of the passage and the reciprocating rate of the delivery member.
申请公布号 EP2554954(B1) 申请公布日期 2016.05.04
申请号 EP20120178814 申请日期 2012.08.01
申请人 FIRST SOLAR MALAYSIA SDN.BHD 发明人 LITTLE, EDWIN JACKSON
分类号 G01F11/18;C23C14/06;C23C14/24 主分类号 G01F11/18
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